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5 Results:AA:SEBASTIAN PP:INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS 0.124 sec.
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1
A Review of the Systems Approach to the Analysis of Dynamic-Mode Atomic Force Microscopy.
A Review of the Systems Approach to the Analysis of Dynamic-Mode Atomic Force Microscopy.
Abu Sebastian, | Institute of Electrical and Electronics Engineers | 2007 ,
2
Control of MEMS-Based Scanning-Probe Data-Storage Devices.
Control of MEMS-Based Scanning-Probe Data-Storage Devices.
Angeliki Pantazi, | Institute of Electrical and Electronics Engineers | 2007 ,
3
Computer-automated multiparadigm modeling in control systems technology
Computer-automated multiparadigm modeling in control systems technology
Pieter J. Mosterman, | Institute of Electrical and Electronics Engineers | 2004 ,
4
Guest Editorial Computer Automated Multiparadigm Modeling (CAMPAM).
Guest Editorial Computer Automated Multiparadigm Modeling (CAMPAM).
Sebastian Engell, | Institute of Electrical and Electronics Engineers | 2004 ,
5
Design methodologies for robust nano-positioning
Design methodologies for robust nano-positioning
Abu Sebastian, | Institute of Electrical and Electronics Engineers | 2005 ,
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