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2 Results:AA:P ROY PP:INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS 0.203 sec.
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1
Control of a III-V MOCVD process using ultraviolet absorption and ultrasonic concentration monitoring
Control of a III-V MOCVD process using ultraviolet absorption and ultrasonic concentration monitoring
M. Gaffney Flynn, | Institute of Electrical and Electronics Engineers | 2001 ,
2
Process Variation in Embedded Memories: Failure Analysis and Variation Aware Architecture
Process Variation in Embedded Memories: Failure Analysis and Variation Aware Architecture
Agarwal, A, | Institute of Electrical and Electronics Engineers | 2005 ,
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