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1
Testing and testable design of high-density random-access memories
Testing and testable design of high-density random-access memories
Mazumder, Pinaki, 566.4-M476t | Kluwer Academic publishers | 1996 566.4-M476t,
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Fault-tolerance and reliability techniques for high-density random-access memories
Fault-tolerance and reliability techniques for high-density random-access memories
Chakraborty, Kanad., 566.43-C435f | Prentice Hall | 2002 566.43-C435f,
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