본문

  1. Home
1 Results:AA:HOFMAN R H PP:대한전자공학회 AA:SANGMIN SHIN 0.89 sec.
RSS 
Multilingual
 חיפוש מתקדם
 חיפוש חדש ההגעה
Selected Print Select Export to Excel
1
Comparison of Retention Characteristics of Ferroelectric Capacitors with Pb(Zr,Ti)O3 Films Deposited by various Methods for High-density Non-volatile Memory
Comparison of Retention Characteristics of Ferroelectric Capacitors with Pb(Zr,Ti)O3 Films Deposited by various Methods for High-density Non-volatile Memory
Sangmin Shin, | 대한전자공학회 | 2003 ,
처음1마지막