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1
Analytical model for transfer length prediction of 13 mm prestressing strand
Analytical model for transfer length prediction of 13 mm prestressing strand
Marti-Vargas, J.R., | 국제구조공학회(TECNO-PRESS) | 2007 ,
2
Trade-off Characteristic between Gate Length Margin and Hot Carrier Lifetime by Considering ESD on NMOSFETs of Submicron Technology
Trade-off Characteristic between Gate Length Margin and Hot Carrier Lifetime by Considering ESD on NMOSFETs of Submicron Technology
Bong-Kyu Joung, | 한국전기전자재료학회 | 2007 ,
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