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Composition Determination of Si/Sil-xGex/Si by Photoreflectance Spectroscopy
Composition Determination of Si/Sil-xGex/Si by Photoreflectance Spectroscopy
Changchun Chen, P.V. Kelly, Zhihong Liu, | 대한금속.재료학회 | 2004 ,
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1
Optics & Spectroscopy
MAIK Nauka Interperiodica [, ]
2
Spectroscopy
Advanstar Communications Inc. [, ]
3
Spectroscopy: An International Journal
IOS Press [, ]
4
Spectroscopy Letters
Marcel Dekker Inc. [, ]