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Min-Seong Kim, Chang-Hyun Kim, Ju-Jang Lee,
| The Korean Institute of Electrical Eng. |
2004
,
2
Taek-Dong Yeo, Young- Man Yoon,
| Korea Trade Research Association Inc. |
2004
,
3
Li Lin, Zheng Liu, Lijia Chen,
| 대한금속.재료학회 |
2004
,
4
Evolution of Interface Voids under Current and Temperature Stress in Integrate Circuit Metallization
J.H. Choy, K.L. Kavanagh, Y.C. Kim,
| 대한금속.재료학회 |
2004
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Автор
- Taek-Dong Yeo, Young- Man Yoon (1+)
- Min-Seong Kim, Chang-Hyun Kim, Ju-Jang Lee (1+)
- Li Lin, Zheng Liu, Lijia Chen (1+)
- J.H. Choy, K.L. Kavanagh, Y.C. Kim (1+)
Издатель
- 대한금속.재료학회 (2+)
- The Korean Institute of Electrical Eng. (1+)
- Korea Trade Research Association Inc. (1+)
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