1
Seok-Beom Choi,
| Korea Trade Research Association Inc. |
2004
,
2
FY Zhai, HJ Wang, SY Chang, D Fu, K Ge, BM Popkin,
| The Korean Society of Community Nutritio |
2004
,
3
Evolution of Interface Voids under Current and Temperature Stress in Integrate Circuit Metallization
J.H. Choy, K.L. Kavanagh, Y.C. Kim,
| 대한금속.재료학회 |
2004
,
4
Jin-Seok Oh, Jong-Do Kim,
| 대한기계학회 |
2004
,
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