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Aging Effect를 고려한 점성토의 압밀특성
Aging Effect를 고려한 점성토의 압밀특성
김영수 ( Young Su Kim ), | 한국지반공학회 | 2004 ,
2
Thermal Stability and Electrical Properties of HfOxNy, Gate Dielectrics with TaN Gate Electrode
Thermal Stability and Electrical Properties of HfOxNy, Gate Dielectrics with TaN Gate Electrode
Jeon Ho Kim, | 한국전기전자재료학회 | 2004 ,
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