1
Sung-Hoe Huh,
| 전력전자학회 |
2004
,
2
Jonathan Hui, John Choy, Sid P. Suwandaratne, Jen,
| Korean Socity of Food Science&Nutrition |
2004
,
3
J.H. Choy,
| 대한금속.재료학회 |
2004
,
4
Evolution of Interface Voids under Current and Temperature Stress in Integrate Circuit Metallization
J.H. Choy, K.L. Kavanagh, Y.C. Kim,
| 대한금속.재료학회 |
2004
,
5
Cho Young Han, Joon-Min Choi,
| 대한기계학회 |
2004
,
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- Sung-Hoe Huh (1+)
- Jonathan Hui, John Choy, Sid P. Suwandaratne, Jen (1+)
- J.H. Choy, K.L. Kavanagh, Y.C. Kim (1+)
- J.H. Choy (1+)
- Cho Young Han, Joon-Min Choi (1+)
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