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An Electrochemical Etching Procedure for Fabricating Scanning Tunneling Microscopy and Atom-Probe Field-Ion Microscopy Tips
An Electrochemical Etching Procedure for Fabricating Scanning Tunneling Microscopy and Atom-Probe Field-Ion Microscopy Tips
Yeong-Cheol Kim,David N Seidman, | 대한금속.재료학회 | 2003 ,
처음1마지막
1
Journal of Microscopy
Blackwell Publishing Limited [, ]
2
Probe Microscopy
Taylor & Francis Ltd [, ]