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951
Influence of Exygen on the Electrical Properties of Aluninum-Doped Zine-Oxide thin Films
Influence of Exygen on the Electrical Properties of Aluninum-Doped Zine-Oxide thin Films
Se-Hyun Kim, | 한국물리학회 | 2006 ,
952
Phase Transition Characteristics of Nitrogen-Doped Antimony-Telluride (N-Sb₂Te₃) Thin Films for a Phase Change Random Access Memory
Phase Transition Characteristics of Nitrogen-Doped Antimony-Telluride (N-Sb₂Te₃) Thin Films for a Phase Change Random Access Memory
Jin Ho Oh, | 한국물리학회 | 2006 ,
953
Isolation Effect on Organic Thin Film Transistors for Low Hysteresis Characteristics
Isolation Effect on Organic Thin Film Transistors for Low Hysteresis Characteristics
Jung Hun Lee, | 한국물리학회 | 2006 ,
954
Resistance Changes of Pr0.7Ca0.3MnO3 ffilms Deposited Through rf-Magnetron Sputtering
Resistance Changes of Pr0.7Ca0.3MnO3 ffilms Deposited Through rf-Magnetron Sputtering
Kwangseok Lee, | 한국물리학회 | 2006 ,
955
Local Structural Changes Caused in Ni-Mn-Ga Alloy Films by Thermal Effects
Local Structural Changes Caused in Ni-Mn-Ga Alloy Films by Thermal Effects
Y. S. Lee, | 한국물리학회 | 2006 ,
956
The Structure and Magnetic Properties of High Electrical Resistivity Granular Films
The Structure and Magnetic Properties of High Electrical Resistivity Granular Films
Won-Jung Jung, | 한국물리학회 | 2006 ,
957
Anisotropic X-ray Rocking Curve Due to a Damaged Surface Layer in a Freestanding GaN Thick Film
Anisotropic X-ray Rocking Curve Due to a Damaged Surface Layer in a Freestanding GaN Thick Film
S. H. Park, | 한국물리학회 | 2006 ,
958
Roles of Kinetics and Energetics in the Growth of AIN by Plasma-Assisted Molecular Beam Epitaxy
Roles of Kinetics and Energetics in the Growth of AIN by Plasma-Assisted Molecular Beam Epitaxy
I. H. Im, | 한국물리학회 | 2006 ,
959
Characterization of MBE-Grown ZnSe Thin Films by Using Photocurrent Spectroscopy
Characterization of MBE-Grown ZnSe Thin Films by Using Photocurrent Spectroscopy
M. H. Jung, | 한국물리학회 | 2006 ,
960
Evaluation of the Localized Residual Strain States of GaN Layers by Using a TEM-CBED Method
Evaluation of the Localized Residual Strain States of GaN Layers by Using a TEM-CBED Method
Hui-Youn Shin, | 한국물리학회 | 2006 ,
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