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921
The Effect of the C Incorporation Pathway on the Growth Rate of Epitaxial SiGec
The Effect of the C Incorporation Pathway on the Growth Rate of Epitaxial SiGec
H.-W. Kim, | 한국물리학회 | 2007 ,
922
Spectroscopic Evidence for the Defect-Mediated Generation-recomvination Model for the Hole Capacitance fof Amorphous Silicon in a Metal-Insulator-Semiconductor Capacitor
Spectroscopic Evidence for the Defect-Mediated Generation-recomvination Model for the Hole Capacitance fof Amorphous Silicon in a Metal-Insulator-Semiconductor Capacitor
Geuk-Jeong Bang, | 한국물리학회 | 2007 ,
923
In-Situ Annealing Study on the Thermal Stability of Nickel Germanides
In-Situ Annealing Study on the Thermal Stability of Nickel Germanides
Jae-Wook Lee, | 한국물리학회 | 2007 ,
924
Annealing Behavior of Bi₂Te₃ Thermoelectric Semiconductor Electrodeposited for Nanowire Applications
Annealing Behavior of Bi₂Te₃ Thermoelectric Semiconductor Electrodeposited for Nanowire Applications
Min-Young Kim, | 한국물리학회 | 2007 ,
925
Study of the Characteristics of HfO₂/Hf Films Prepared by Atomic Layer Deposition on Silicon
Study of the Characteristics of HfO₂/Hf Films Prepared by Atomic Layer Deposition on Silicon
Seung-Woo Do, | 한국물리학회 | 2007 ,
926
The Electronic and Optical Properties of IZO Thin Films Prepared by Pulsed DC Magnetron Sputtering
The Electronic and Optical Properties of IZO Thin Films Prepared by Pulsed DC Magnetron Sputtering
S. T. Kim, | 한국물리학회 | 2007 ,
927
Remaining Oxide and Low-Energy Ion Implantation of BF₂+ for Si(100)
Remaining Oxide and Low-Energy Ion Implantation of BF₂+ for Si(100)
Woo-Jung Lee, | 한국물리학회 | 2007 ,
928
Analysis of the Surface Morphology and the Resistance of VO₂ Thin films ofn M-Plane Al₂O₃
Analysis of the Surface Morphology and the Resistance of VO₂ Thin films ofn M-Plane Al₂O₃
Bong-Jun Kim, | 한국물리학회 | 2007 ,
929
Characteristics of W-B-C-N Thin Diffusion Barrier for Cu Interconnects
Characteristics of W-B-C-N Thin Diffusion Barrier for Cu Interconnects
Soo In Kim, | 한국물리학회 | 2007 ,
930
A Study on the Electrochemical and the Chemical Mechanical Polishing Behaviors of W and Ti Film
A Study on the Electrochemical and the Chemical Mechanical Polishing Behaviors of W and Ti Film
Yong-Jin Seo, | 한국물리학회 | 2007 ,
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