본문

  1. Home
1000 Results:AA:KIM IN SU 0.452 sec.
RSS 
다국어입력
 상세검색
 신착검색
선택출력 선택엑셀내보내기
911
Structural and Optoelectronic Properties of SnO2 Nanowires
Structural and Optoelectronic Properties of SnO2 Nanowires
Jong Soo Lee, | 한국전기전자재료학회 | 2005 ,
912
Eu-doped LGF Luminescent Down Converter Possible for TiO2 Dye Sensitized Solar Cells
Eu-doped LGF Luminescent Down Converter Possible for TiO2 Dye Sensitized Solar Cells
Hyun Ju Kim, | 한국전기전자재료학회 | 2005 ,
913
Flux Pinning Enhancement and Irreversibility Line of Sm doped YBCO Superconductor by Zone Melt Growth Process
Flux Pinning Enhancement and Irreversibility Line of Sm doped YBCO Superconductor by Zone Melt Growth Process
So Jung Kim, | 한국전기전자재료학회 | 2005 ,
914
PZT-PMN Ceramics for Large Displacement Piezoelectric Devices
PZT-PMN Ceramics for Large Displacement Piezoelectric Devices
Kee Joe Lim, | 한국전기전자재료학회 | 2005 ,
915
Plant Regeneration from Embryogenic Suspension Cultures of Soybean ( Glycine max L. Merrill )
Plant Regeneration from Embryogenic Suspension Cultures of Soybean ( Glycine max L. Merrill )
Gi-Won Jang, | 한국식물학회 | 2001 ,
916
Application of CBD Zinc Sulfide (ZnS) Film to Low Cost Antireflection Coating on Large Area Industrial Silicon Solar Cell
Application of CBD Zinc Sulfide (ZnS) Film to Low Cost Antireflection Coating on Large Area Industrial Silicon Solar Cell
U. Gangopadhyay, | 한국전기전자재료학회 | 2005 ,
917
Time-Resolved Photoluminescence Measurement of Frenkeltype Excitonic Lifetimes in InGaN/GaN Multi-quantum Well Structures
Time-Resolved Photoluminescence Measurement of Frenkeltype Excitonic Lifetimes in InGaN/GaN Multi-quantum Well Structures
Gwi Su Shin, | 한국전기전자재료학회 | 2004 ,
918
Structural Properties of Dielectric Barrier Reactor with Hole (DBH) for CF4 Decomposition
Structural Properties of Dielectric Barrier Reactor with Hole (DBH) for CF4 Decomposition
Jung Gun Jung, | 한국전기전자재료학회 | 2004 ,
919
Metal Surface Treatment Effects on Screen Printed Silicon Solar Cells
Metal Surface Treatment Effects on Screen Printed Silicon Solar Cells
K. Chakrabarty, | 한국전기전자재료학회 | 2004 ,
920
Thermal Stability and Electrical Properties of HfOxNy, Gate Dielectrics with TaN Gate Electrode
Thermal Stability and Electrical Properties of HfOxNy, Gate Dielectrics with TaN Gate Electrode
Jeon Ho Kim, | 한국전기전자재료학회 | 2004 ,
처음이전87888990919293949596이후마지막