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901
Comparison of Surface Passivation Layers on InGaN/GaN MQW LEDs
Comparison of Surface Passivation Layers on InGaN/GaN MQW LEDs
Hyuck Soo Yang, | 대한전자공학회 | 2005 ,
902
Green and Blue Light Emitting InN/GaN Quantum Wells with Nanosize Structures Grown by Metalorganic Chemical Vapor Deposition
Green and Blue Light Emitting InN/GaN Quantum Wells with Nanosize Structures Grown by Metalorganic Chemical Vapor Deposition
Je Won Kim, | 대한전자공학회 | 2005 ,
903
Device Characteristics of A1GaN/GaN MIS-HFET using A12O3 Based High-k Dielectric
Device Characteristics of A1GaN/GaN MIS-HFET using A12O3 Based High-k Dielectric
Ki-Yeol Park, | 대한전자공학회 | 2005 ,
904
A Low Dark Current CMOS Image Sensor Pixel with a Photodiode Structure Enclosed by P-well
A Low Dark Current CMOS Image Sensor Pixel with a Photodiode Structure Enclosed by P-well
Sang-Wook han, | 대한전자공학회 | 2005 ,
905
Quantitative Analysis on Voltage Schemes for Reliable Operations of a Floating Gate Type Double Gate Nonvolatile Memory Cell
Quantitative Analysis on Voltage Schemes for Reliable Operations of a Floating Gate Type Double Gate Nonvolatile Memory Cell
Seongjae Cho, | 대한전자공학회 | 2005 ,
906
A New EEPROM with Side Floating Gates having Different Work Function from Control Gate
A New EEPROM with Side Floating Gates having Different Work Function from Control Gate
Youngjoon Ahn, | 대한전자공학회 | 2002 ,
907
Fabrication Uncertainty and Noise Issues in high-Precision MEMS Actuators and Sensors
Fabrication Uncertainty and Noise Issues in high-Precision MEMS Actuators and Sensors
Young-Ho Cho, | 대한전자공학회 | 2002 ,
908
Fabrication of 3D Microstructures with Single uv Lithography Step
Fabrication of 3D Microstructures with Single uv Lithography Step
Man Hee Han, | 대한전자공학회 | 2002 ,
909
Process-Structure-Property Relationship and its Impact on Microelectronics Device Reliability and Failure Mechanism
Process-Structure-Property Relationship and its Impact on Microelectronics Device Reliability and Failure Mechanism
Chih Hang Tung, | 대한전자공학회 | 2003 ,
910
Design Consideration of Body-Tied FinFETs(\{Omega}MOSFETs) Implemented on Bulk Si Wafers
Design Consideration of Body-Tied FinFETs(\{Omega}MOSFETs) Implemented on Bulk Si Wafers
Kyoung-Rok Han, | 대한전자공학회 | 2004 ,
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