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81
S and N Fertilizations Affect the Content of Desulfoglucosinolates in Broccoli Sprouts
S and N Fertilizations Affect the Content of Desulfoglucosinolates in Broccoli Sprouts
Jun Gu Lee, | 한국원예학회 | 2005 ,
82
Design and Fabrication of the 0.1 ㎛ Γ-Shaped Gate PHEMT
Design and Fabrication of the 0.1 ㎛ Γ-Shaped Gate PHEMT
Seong Dae Lee, | 한국전자파학회 | 2001 ,
83
Bias 전압에 따른 ZnO:Al 투명전도막의 전기적 특성
Bias 전압에 따른 ZnO:Al 투명전도막의 전기적 특성
박강일 ( Kang Il Park ), | 한국전기전자재료학회 | 2004 ,
84
Liquid Crystal Aligning Capabilities Treated on Organic Overcoat Thin Films by Ion Beam Irradiation Method
Liquid Crystal Aligning Capabilities Treated on Organic Overcoat Thin Films by Ion Beam Irradiation Method
Jeong Min Han, | 한국전기전자재료학회 | 2007 ,
85
Instructions for the Preparation of Article for Transactions on Electrical and Electronic Materials (bold, 15 points)
Instructions for the Preparation of Article for Transactions on Electrical and Electronic Materials (bold, 15 points)
Gil Dong Hong, | 한국전기전자재료학회 | 2005 ,
86
Strong Red Photoluminescence from Nano-porous Silicon Formed on Fe-Contaminated Silicon Substrate
Strong Red Photoluminescence from Nano-porous Silicon Formed on Fe-Contaminated Silicon Substrate
Dong Lyeul Kim, | 한국전기전자재료학회 | 2005 ,
87
Electrical Conduction Mechanism in ITO/Alq3/A1 Organic Light-emitting Diodes
Electrical Conduction Mechanism in ITO/Alq3/A1 Organic Light-emitting Diodes
Dong Hoe Chung, | 한국전기전자재료학회 | 2005 ,
88
Circuit Modeling of 3-D Parallel-plate Capacitors Fabricated by LTCC Process
Circuit Modeling of 3-D Parallel-plate Capacitors Fabricated by LTCC Process
Dong Wook Shin, | 한국전기전자재료학회 | 2005 ,
89
Instructions for the Preparation of Article for Transactions on Electrical and Electronic Materials (bold. 15 points)
Instructions for the Preparation of Article for Transactions on Electrical and Electronic Materials (bold. 15 points)
Gil Dong Hong, | 한국전기전자재료학회 | 2004 ,
90
Thermal Stability and Electrical Properties of HfOxNy, Gate Dielectrics with TaN Gate Electrode
Thermal Stability and Electrical Properties of HfOxNy, Gate Dielectrics with TaN Gate Electrode
Jeon Ho Kim, | 한국전기전자재료학회 | 2004 ,
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