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841
Near-field Emission Properties of a Self-formed InAs Quantum Dot Laser diode by Using Near-Field Scanning Optical Microscopy
Near-field Emission Properties of a Self-formed InAs Quantum Dot Laser diode by Using Near-Field Scanning Optical Microscopy
S. I. Jung, | 한국물리학회 | 2007 ,
842
Characteristics of Light Transmission Through Nano-Apertures on Pyramidal Probes
Characteristics of Light Transmission Through Nano-Apertures on Pyramidal Probes
Y. C. Kim, | 한국물리학회 | 2007 ,
843
Adsorption of Benzenethiol and 1,4-Benzenedithiol on the Si(111)-7 X 7 Surface
Adsorption of Benzenethiol and 1,4-Benzenedithiol on the Si(111)-7 X 7 Surface
Jaeyoon Baik, | 한국물리학회 | 2007 ,
844
Effect of Thermal Annealing on the Formation of Preferential c-Axis Orientation and an Interfacial Layer for ZnO Thin films Grown on an n-Si(001) Substrate
Effect of Thermal Annealing on the Formation of Preferential c-Axis Orientation and an Interfacial Layer for ZnO Thin films Grown on an n-Si(001) Substrate
J. M. Yuk, | 한국물리학회 | 2007 ,
845
Abnormal Thermal Properties of ZnS:Mn2+ Nanophosphor
Abnormal Thermal Properties of ZnS:Mn2+ Nanophosphor
J. S. Park, | 한국물리학회 | 2007 ,
846
Time-Integrated and Time-Resolved Photoluminescence Properties of Si Nanocrystal/SiO₂ Multilayers Grown by Ion-Beam Sputtering
Time-Integrated and Time-Resolved Photoluminescence Properties of Si Nanocrystal/SiO₂ Multilayers Grown by Ion-Beam Sputtering
Sung Kim, | 한국물리학회 | 2007 ,
847
Characterization of Polycrystalline SrRuO₃ Thin Films Deposited by DC Magnetron Sputtering Method
Characterization of Polycrystalline SrRuO₃ Thin Films Deposited by DC Magnetron Sputtering Method
Sanghyun Park, | 한국물리학회 | 2007 ,
848
Ferroelectric and Relaxor Behavior of Fe-Doped Sr0.5Ba0.5Nb₂_xFeχO6 Ceramics with a Tungsten-Bronze Structure
Ferroelectric and Relaxor Behavior of Fe-Doped Sr0.5Ba0.5Nb₂_xFeχO6 Ceramics with a Tungsten-Bronze Structure
Jin Soo Kim, | 한국물리학회 | 2007 ,
849
Thickness Dependence of Domain Switching of Ferroelectric PbZr0.35Ti0.65O₃ Thin Film by Scanning Probe Microscopy
Thickness Dependence of Domain Switching of Ferroelectric PbZr0.35Ti0.65O₃ Thin Film by Scanning Probe Microscopy
C. H. Kim, | 한국물리학회 | 2007 ,
850
Temperature Dependence of the Electrical Conductivity for BaTi₂O5 Glass
Temperature Dependence of the Electrical Conductivity for BaTi₂O5 Glass
J. K. Lee, | 한국물리학회 | 2007 ,
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