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811
Optiminzation of 660-nm-Band AlGaInP Laser Diodes by Using Deep-Level Transient Spectroscopy Analyses
Optiminzation of 660-nm-Band AlGaInP Laser Diodes by Using Deep-Level Transient Spectroscopy Analyses
Young Chul Shin, | 한국물리학회 | 2007 ,
812
A Flip-chip-Packaged InP HBT Transimpedance Amplifier for 40-Gb/s Optical Link Applications
A Flip-chip-Packaged InP HBT Transimpedance Amplifier for 40-Gb/s Optical Link Applications
Chul-Won JU, | 한국물리학회 | 2007 ,
813
Experimental Studies of Low-Field Landau Quantization in Two-dimensional Electron Systems in GaAs/AlGaAs Heterostructures
Experimental Studies of Low-Field Landau Quantization in Two-dimensional Electron Systems in GaAs/AlGaAs Heterostructures
Jing-Han Chen, | 한국물리학회 | 2007 ,
814
Adsorption of Benzenethiol and 1,4-Benzenedithiol on the Si(111)-7 X 7 Surface
Adsorption of Benzenethiol and 1,4-Benzenedithiol on the Si(111)-7 X 7 Surface
Jaeyoon Baik, | 한국물리학회 | 2007 ,
815
Annealing Behavior of Bi₂Te₃ Thermoelectric Semiconductor Electrodeposited for Nanowire Applications
Annealing Behavior of Bi₂Te₃ Thermoelectric Semiconductor Electrodeposited for Nanowire Applications
Min-Young Kim, | 한국물리학회 | 2007 ,
816
(우주 속의 대한민국) 아리랑위성 2호 백서
(우주 속의 대한민국) 아리랑위성 2호 백서
한국항공우주연구원, 558.92-한16아-R | 교육과학기술부:한국항공우주연구원 | 2009 558.92-한16아-R,
817
Time-Integrated and Time-Resolved Photoluminescence Properties of Si Nanocrystal/SiO₂ Multilayers Grown by Ion-Beam Sputtering
Time-Integrated and Time-Resolved Photoluminescence Properties of Si Nanocrystal/SiO₂ Multilayers Grown by Ion-Beam Sputtering
Sung Kim, | 한국물리학회 | 2007 ,
818
Measurement of Micro-Elasticity within a Fertilized Egg by Using Brillouin Scattering Spectroscopy
Measurement of Micro-Elasticity within a Fertilized Egg by Using Brillouin Scattering Spectroscopy
Y. Fujimura, | 한국물리학회 | 2007 ,
819
Characterization of Polycrystalline SrRuO₃ Thin Films Deposited by DC Magnetron Sputtering Method
Characterization of Polycrystalline SrRuO₃ Thin Films Deposited by DC Magnetron Sputtering Method
Sanghyun Park, | 한국물리학회 | 2007 ,
820
Domain Switching of Ferroelectric Thin Films by Using a Scanning Probe Microscope
Domain Switching of Ferroelectric Thin Films by Using a Scanning Probe Microscope
J. Y. Son, | 한국물리학회 | 2007 ,
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