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791
Measurement of Capture Cross-Sections for the 165Ho(n, γ)166Ho Reaction in the Neutron Energy Region from 10 to 90 keV
Measurement of Capture Cross-Sections for the 165Ho(n, γ)166Ho Reaction in the Neutron Energy Region from 10 to 90 keV
Tae-Ik Ro, | 한국물리학회 | 2007 ,
792
Energy Shift During Ion Extraction from an ICP Source
Energy Shift During Ion Extraction from an ICP Source
O. V. Vozniy, | 한국물리학회 | 2007 ,
793
Characteristics of Cobalt Films Deposited by Using a Remote Plasma ALD Method with a CpCo(Co)₂ Precursor
Characteristics of Cobalt Films Deposited by Using a Remote Plasma ALD Method with a CpCo(Co)₂ Precursor
Keunwoo Lee, | 한국물리학회 | 2007 ,
794
Anisotropic Etching of InP and InGaAs by Using an Inductively Coupled Plasma in Cl₂/N₂ and Cl₂/Ar Mixtures at Low Bias Power
Anisotropic Etching of InP and InGaAs by Using an Inductively Coupled Plasma in Cl₂/N₂ and Cl₂/Ar Mixtures at Low Bias Power
J. W. Bae, | 한국물리학회 | 2007 ,
795
Structural and Optical Properties of AgInSe₂ Films Prepared on Indium Tin Oxide Substrates
Structural and Optical Properties of AgInSe₂ Films Prepared on Indium Tin Oxide Substrates
Jeoung Ju Lee, | 한국물리학회 | 2007 ,
796
Study of SnO₂Nanorods Coated Using the PECVD Technique
Study of SnO₂Nanorods Coated Using the PECVD Technique
Hyoun Woo Kim, | 한국물리학회 | 2007 ,
797
Gate Recess Process for 80-nm T-Shaped Gate Metamorphic HEMTs on GaAs Substrates
Gate Recess Process for 80-nm T-Shaped Gate Metamorphic HEMTs on GaAs Substrates
Hyung Sup Yoon, | 한국물리학회 | 2007 ,
798
The Optical Characteristics of Epitaxial Lateral and Vertical Overgrowth of GaN on Stripe-Patterned Si Substrate
The Optical Characteristics of Epitaxial Lateral and Vertical Overgrowth of GaN on Stripe-Patterned Si Substrate
H. Y. Yeo, | 한국물리학회 | 2007 ,
799
High Potential Barrier Effects on Self-Assembled InAs Quantum Dots
High Potential Barrier Effects on Self-Assembled InAs Quantum Dots
S. I. Jung, | 한국물리학회 | 2007 ,
800
Near-field Emission Properties of a Self-formed InAs Quantum Dot Laser diode by Using Near-Field Scanning Optical Microscopy
Near-field Emission Properties of a Self-formed InAs Quantum Dot Laser diode by Using Near-Field Scanning Optical Microscopy
S. I. Jung, | 한국물리학회 | 2007 ,
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