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641
An Elastic Deformation Model of High-Speed Spindle Units
An Elastic Deformation Model of High-Speed Spindle Units
Igor Aexeevich Zverev., | 한국정밀공학회 | 2006 ,
642
Fast Binary Block Inverse Jacket Transform
Fast Binary Block Inverse Jacket Transform
Moon Ho Lee., | 한국전자파학회 | 2006 ,
643
An Oscillator Incorporating a Planar Helical Resonator for Phase Noise Reduction and Harmoic Supression
An Oscillator Incorporating a Planar Helical Resonator for Phase Noise Reduction and Harmoic Supression
Cheol-Gyu Hwang., | 한국전자파학회 | 2006 ,
644
Magnetic, Structural, and Electrical Properties of Si1-xMnx Single Crystals
Magnetic, Structural, and Electrical Properties of Si1-xMnx Single Crystals
Younghun HWANG, | 한국물리학회 | 2006 ,
645
Analysis of Pickup Signals in the Time Domain and the Frequency Domain for the Beam Position Monitor at the Pohang Light Source
Analysis of Pickup Signals in the Time Domain and the Frequency Domain for the Beam Position Monitor at the Pohang Light Source
J.Y. Huang, | 한국물리학회 | 2006 ,
646
RF Power Coupling for the PEFP Drift Tube Linac
RF Power Coupling for the PEFP Drift Tube Linac
Han Sung Kim, | 한국물리학회 | 2006 ,
647
Effects of a Transverse Magnetic Fiedl on an RF-Driven H Ion Source
Effects of a Transverse Magnetic Fiedl on an RF-Driven H Ion Source
In Seok Hong, | 한국물리학회 | 2006 ,
648
Excitation Transport by the Resonant Dipole-Dipole Interaction in a Closely Packed Quantum-Dot Film
Excitation Transport by the Resonant Dipole-Dipole Interaction in a Closely Packed Quantum-Dot Film
Suc-kyoung Hong., | 한국물리학회 | 2006 ,
649
A 10-Gb/s Planar InGaAs/InP Avalanche Photodiode with a Thin Multiplication Layer Fabricated by Using Recess-Etching and Single-Diffusion Processes
A 10-Gb/s Planar InGaAs/InP Avalanche Photodiode with a Thin Multiplication Layer Fabricated by Using Recess-Etching and Single-Diffusion Processes
Sungmin Hwang., | 한국물리학회 | 2006 ,
650
Piezoelectric Properties of Highly Oriented Lead-Free Na0.5K0.5NbO₃ Films as Determined Using Piezoelectric Force Microscopy
Piezoelectric Properties of Highly Oriented Lead-Free Na0.5K0.5NbO₃ Films as Determined Using Piezoelectric Force Microscopy
J.S. Kim., | 한국물리학회 | 2006 ,
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