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581
After an English Language Policy Initiative: Listening to the Voices of Classroom Implementers
After an English Language Policy Initiative: Listening to the Voices of Classroom Implementers
Chan Swee Heong, | 범태평양응용언어학회 | 2005 ,
582
Incorporating MALL into EFL Reading Instruction for Middle School Students
Incorporating MALL into EFL Reading Instruction for Middle School Students
Byung Bin Im, | 범태평양응용언어학회 | 2005 ,
583
Characteristics of Korean EFL Learners` Written Productions and Their Pedagogical Implications
Characteristics of Korean EFL Learners` Written Productions and Their Pedagogical Implications
Eun Ha Lee, | 범태평양응용언어학회 | 2005 ,
584
A Low Dark Current CMOS Image Sensor Pixel with a Photodiode Structure Enclosed by P-well
A Low Dark Current CMOS Image Sensor Pixel with a Photodiode Structure Enclosed by P-well
Sang-Wook han, | 대한전자공학회 | 2005 ,
585
Physics-based Algorithm Implementation for Characterization of Gate-dielectric Engineered MOSFETs including Quantization Effects
Physics-based Algorithm Implementation for Characterization of Gate-dielectric Engineered MOSFETs including Quantization Effects
Tina Mangla, | 대한전자공학회 | 2005 ,
586
Physics-based Algorithm Implementation for Characterization of Gate-dielectric Engineered MOSFETs including Quantization Effects
Physics-based Algorithm Implementation for Characterization of Gate-dielectric Engineered MOSFETs including Quantization Effects
Tina Mangla, | 대한전자공학회 | 2002 ,
587
CCD Image Sensor with Variable Rest Operation
CCD Image Sensor with Variable Rest Operation
Sangsik Park, | 대한전자공학회 | 2003 ,
588
Improved Breakdown Voltage Characteristics of In0.5Ga0.5P/In0.22Ga0.78As/GaAs p-HEMT with an Oxidized GaAs Gate
Improved Breakdown Voltage Characteristics of In0.5Ga0.5P/In0.22Ga0.78As/GaAs p-HEMT with an Oxidized GaAs Gate
I-H.Kang, | 대한전자공학회 | 2003 ,
589
Process-Structure-Property Relationship and its Impact on Microelectronics Device Reliability and Failure Mechanism
Process-Structure-Property Relationship and its Impact on Microelectronics Device Reliability and Failure Mechanism
Chih Hang Tung, | 대한전자공학회 | 2003 ,
590
Design Consideration of Body-Tied FinFETs(\{Omega}MOSFETs) Implemented on Bulk Si Wafers
Design Consideration of Body-Tied FinFETs(\{Omega}MOSFETs) Implemented on Bulk Si Wafers
Kyoung-Rok Han, | 대한전자공학회 | 2004 ,
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