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551
Development of Discriminant Analysis System by Graphical User Interface of Visual Basic
Development of Discriminant Analysis System by Graphical User Interface of Visual Basic
Yong Kyun Lee, | 한국데이터정보과학회 | 2007 ,
552
A Study On Order Structure of SERVPERVAL`s 5 Dimensions
A Study On Order Structure of SERVPERVAL`s 5 Dimensions
Yoon Shik Cho, | 한국데이터정보과학회 | 2007 ,
553
Assessment of the Nitrate Radical Chemistry Chemistry and Chemical Composition on Jeju Island during the Asian Pollution Period in the Spring of 2001
Assessment of the Nitrate Radical Chemistry Chemistry and Chemical Composition on Jeju Island during the Asian Pollution Period in the Spring of 2001
Zang-Ho Shon, | 한국대기환경학회 | 2003 ,
554
Phase Transformation of Metastable Beta Ti Alloys with Tweed Structure
Phase Transformation of Metastable Beta Ti Alloys with Tweed Structure
Byung-Hak Choe, | 대한금속재료학회 | 2005 ,
555
Effect of Precipitation from Tweed Matrix on the Mechanical Properties in a Metastable Beta Alloy of Ti-15-3
Effect of Precipitation from Tweed Matrix on the Mechanical Properties in a Metastable Beta Alloy of Ti-15-3
Byung-Hak Choe, | 대한금속재료학회 | 2005 ,
556
Fracture Detection in Concrete by Glass Fiber Cloth ReinForced Plastics
Fracture Detection in Concrete by Glass Fiber Cloth ReinForced Plastics
Soon-Gi Shin, | 대한금속재료학회 | 2006 ,
557
Reappraisal of Grain Boundary Diffusion Creep Equations for Nanocrystalline Materials
Reappraisal of Grain Boundary Diffusion Creep Equations for Nanocrystalline Materials
Kyung-Tae Park, | 대한금속재료학회 | 2006 ,
558
In-Situ Magneto-Optical Kerr Effect Studies of Exchange-Bias Formations in Ferromagnetic/Antiferromagnetic Thin Film Systems
In-Situ Magneto-Optical Kerr Effect Studies of Exchange-Bias Formations in Ferromagnetic/Antiferromagnetic Thin Film Systems
Young-Sang Yu, | 대한금속재료학회 | 2005 ,
559
Metamorphic HEMT Devices and MMICs' for Millimeter-wave System Applications
Metamorphic HEMT Devices and MMICs' for Millimeter-wave System Applications
Kyung Ho Lee, | 대한금속재료학회 | 2005 ,
560
Measurement and Visualization of Doping Profile in Silicon Using Kelvin Probe Force Microscopy (KPFM)
Measurement and Visualization of Doping Profile in Silicon Using Kelvin Probe Force Microscopy (KPFM)
Hyungjung Shin, | 대한금속재료학회 | 2005 ,
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