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471
Phase Transition Characteristics of Nitrogen-Doped Antimony-Telluride (N-Sb₂Te₃) Thin Films for a Phase Change Random Access Memory
Phase Transition Characteristics of Nitrogen-Doped Antimony-Telluride (N-Sb₂Te₃) Thin Films for a Phase Change Random Access Memory
Jin Ho Oh, | 한국물리학회 | 2006 ,
472
Influence of High Temperature Annealing on the Magnetic and the Structural Properties of Co Ion-Implanted ZnO Single Crystals
Influence of High Temperature Annealing on the Magnetic and the Structural Properties of Co Ion-Implanted ZnO Single Crystals
Woochul Kim, | 한국물리학회 | 2006 ,
473
Anisotropic X-ray Rocking Curve Due to a Damaged Surface Layer in a Freestanding GaN Thick Film
Anisotropic X-ray Rocking Curve Due to a Damaged Surface Layer in a Freestanding GaN Thick Film
S. H. Park, | 한국물리학회 | 2006 ,
474
Structural Properties of CrN Buffers for GaN Growth
Structural Properties of CrN Buffers for GaN Growth
W. H. Lee, | 한국물리학회 | 2006 ,
475
Roles of Kinetics and Energetics in the Growth of AIN by Plasma-Assisted Molecular Beam Epitaxy
Roles of Kinetics and Energetics in the Growth of AIN by Plasma-Assisted Molecular Beam Epitaxy
I. H. Im, | 한국물리학회 | 2006 ,
476
Characteristics of Hydrogen Storage Alloy p-GaN Ohmic Contacts for InGaN LEDs
Characteristics of Hydrogen Storage Alloy p-GaN Ohmic Contacts for InGaN LEDs
Seung Wan Chae, | 한국물리학회 | 2006 ,
477
Effects of the Surface Relief Profile on Liqued Crystal Aligning Capabilities of Laser-Induced Periodic Surface Structures
Effects of the Surface Relief Profile on Liqued Crystal Aligning Capabilities of Laser-Induced Periodic Surface Structures
Jong Jin Lee, | 한국물리학회 | 2006 ,
478
Characterization of MBE-Grown ZnSe Thin Films by Using Photocurrent Spectroscopy
Characterization of MBE-Grown ZnSe Thin Films by Using Photocurrent Spectroscopy
M. H. Jung, | 한국물리학회 | 2006 ,
479
Thin-Film Transistors Based on ZnO Fabricated by Using Radio-Frequency Magnetron Sputtering
Thin-Film Transistors Based on ZnO Fabricated by Using Radio-Frequency Magnetron Sputtering
R. Navamathavan, | 한국물리학회 | 2006 ,
480
Mask Error Enhancement Factor Variation With Pattern Density for 65 nm and 90 nm Line Widths
Mask Error Enhancement Factor Variation With Pattern Density for 65 nm and 90 nm Line Widths
Hye-Young Kang, | 한국물리학회 | 2006 ,
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