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461
Fabrication of Two-Dimensional Periodic Structures in an Amorphous Silicon Film by Four-Beam Interference Lithography
Fabrication of Two-Dimensional Periodic Structures in an Amorphous Silicon Film by Four-Beam Interference Lithography
Geon Joon Lee, | 한국물리학회 | 2007 ,
462
Study on the Characteristics of SiO₂ Films Prepared by Hydrogen-Assisted Low-Pressure Radical Oxidation Using Batch-Type Equipment with a 100-Wafers of 300-mm-Diameter Capability
Study on the Characteristics of SiO₂ Films Prepared by Hydrogen-Assisted Low-Pressure Radical Oxidation Using Batch-Type Equipment with a 100-Wafers of 300-mm-Diameter Capability
Jae-Jong Han, | 한국물리학회 | 2006 ,
463
체 게바라 혁명적 인간
체 게바라 혁명적 인간
앤더슨, 존 리, 342.8099-앤24체 | 플래닛 | 2010 342.8099-앤24체,
464
Online System for Normalizing Data Acquired by the Fermilav do Experiment
Online System for Normalizing Data Acquired by the Fermilav do Experiment
Sung Keun Park, | 한국물리학회 | 2006 ,
465
LDA+U Study on fully Relaxed LaTiO₃and (SrTiO₃)m(LaTiO₃)n Superlattice Structures
LDA+U Study on fully Relaxed LaTiO₃and (SrTiO₃)m(LaTiO₃)n Superlattice Structures
Hyo-Shin Ahn, | 한국물리학회 | 2006 ,
466
Electron Behavior and Impurity Properties as Functions of Growth Temperature for InN Grown by Using Plasma-Assisted Molecular Beam Epitaxy
Electron Behavior and Impurity Properties as Functions of Growth Temperature for InN Grown by Using Plasma-Assisted Molecular Beam Epitaxy
E. S. Hwang, | 한국물리학회 | 2006 ,
467
NonLinear Optical Response of 1-D Photonic Crystals Fabricated by Using a Sol-Gel Method
NonLinear Optical Response of 1-D Photonic Crystals Fabricated by Using a Sol-Gel Method
Jisoo Hwang, | 한국물리학회 | 2006 ,
468
Low-Frequency Noise In High-k Gate Dielectric Nanoscale MOSFET's
Low-Frequency Noise In High-k Gate Dielectric Nanoscale MOSFET's
I. K. Han, | 한국물리학회 | 2006 ,
469
Structural Dependence of the Physical Properties for Co₂MnGa Heusler Alloy Films
Structural Dependence of the Physical Properties for Co₂MnGa Heusler Alloy Films
R. J. Kim, | 한국물리학회 | 2006 ,
470
In-Situ Monitoring of InAs/GaAs QDs by Using Spectral Reflectance
In-Situ Monitoring of InAs/GaAs QDs by Using Spectral Reflectance
E. Ahn, | 한국물리학회 | 2006 ,
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