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451
Low Voltage Program/ Erase Characteristics of Si Nanocrystal Memory with Damascene Gate FinFET on Bulk Si Wafer
Low Voltage Program/ Erase Characteristics of Si Nanocrystal Memory with Damascene Gate FinFET on Bulk Si Wafer
Jeong-Dong Choe., | 대한전자공학회 | 2006 ,
452
Optimum design of plane steel frames with PR-connections using refined plastic hinge analysis and genetic algorithm
Optimum design of plane steel frames with PR-connections using refined plastic hinge analysis and genetic algorithm
Young Mook Yun., | 국제구조공학회(TECNO-PRESS) | 2006 ,
453
A New Way to Improve Product Development Productivity in the Digital Era : Promoting Customer Participation through Virtual Community
A New Way to Improve Product Development Productivity in the Digital Era : Promoting Customer Participation through Virtual Community
Yang , Suk Joon, | 한국생산성학회(Korea Productivity Associ | 2006 ,
454
Comparisons of Spatial - Temporal Characteristics between young and old adults while walking : Factors Influencing the Likelihood of slip - Initiation
Comparisons of Spatial - Temporal Characteristics between young and old adults while walking : Factors Influencing the Likelihood of slip - Initiation
sukwon kim, | 대한인간공학회 | 2006 ,
455
Consumable approaches of polysilicon MEMS CMP
Consumable approaches of polysilicon MEMS CMP
Park, Sungmin, | 한국전기전자재료학회 | 2007 ,
456
Optimum PP fiber dosage for the control of spalling of high strength reinforced concrete columns
Optimum PP fiber dosage for the control of spalling of high strength reinforced concrete columns
Yoo, Suk-Hyeong, | 한국콘크리트학회 | 2006 ,
457
Estimation for the Rayleigh Distribution with Known Parameter under Multiply Type-II Censoring
Estimation for the Rayleigh Distribution with Known Parameter under Multiply Type-II Censoring
Han Jun-Tae, | 한국데이터정보과학회 | 2006 ,
458
Shrinkage Estimator of Dispersion of an Inverse Gaussian Distribusion
Shrinkage Estimator of Dispersion of an Inverse Gaussian Distribusion
Lee In Suk, | 한국데이터정보과학회 | 2006 ,
459
A Study on Probablilty and Statistics Education in High School
A Study on Probablilty and Statistics Education in High School
Kang Suk-Bok, | 한국데이터정보과학회 | 2006 ,
460
Goodness-of-fit Tests for the Weibull Distribution Based on the Sample Entropy
Goodness-of-fit Tests for the Weibull Distribution Based on the Sample Entropy
Kang, Suk-Bok, | 한국데이터정보과학회 | 2006 ,
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