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441
Nanosecond Beam Bunching System
Nanosecond Beam Bunching System
G.D. Kim, | 한국물리학회 | 2006 ,
442
Effect of a Sonusoidal Field in a Switching Magnet for a Proton Beam Accelerator
Effect of a Sonusoidal Field in a Switching Magnet for a Proton Beam Accelerator
Heung Sik Kang, | 한국물리학회 | 2006 ,
443
Effects of a Transverse Magnetic Fiedl on an RF-Driven H Ion Source
Effects of a Transverse Magnetic Fiedl on an RF-Driven H Ion Source
In Seok Hong, | 한국물리학회 | 2006 ,
444
Effects of Be-Codoping on the Properties of GaMnAs Films Grown via Low-Temperature Molecular Beam Epitaxy
Effects of Be-Codoping on the Properties of GaMnAs Films Grown via Low-Temperature Molecular Beam Epitaxy
Fucheng Yu., | 한국물리학회 | 2006 ,
445
Quantum Secure Direct Communication by Using a GHZ State
Quantum Secure Direct Communication by Using a GHZ State
Hong-fu Wang., | 한국물리학회 | 2006 ,
446
First-Principles Study of the Effect of the Superexchange Interaction in (Ga, Mn)V(V=N, P, As and Sb)
First-Principles Study of the Effect of the Superexchange Interaction in (Ga, Mn)V(V=N, P, As and Sb)
Yun Hee Chang., | 한국물리학회 | 2006 ,
447
Alcohol drinking status of officers on a ship and drunk : navigation experiments using ship handling simulator
Alcohol drinking status of officers on a ship and drunk : navigation experiments using ship handling simulator
Yang Chan Su, | 해양환경안전학회 | 2006 ,
448
Analysis of Chemical Bond States and Electrical Properties of Stacked AlON/HfO₂ Gate Oxides Formed by Using a Layer-by-Layer Technique
Analysis of Chemical Bond States and Electrical Properties of Stacked AlON/HfO₂ Gate Oxides Formed by Using a Layer-by-Layer Technique
Wonjoon Choi., | 한국물리학회 | 2006 ,
449
Nonvolatile Memory Characteristics in Metal-Oxide-Semiconductors Containing Metal Nanoparticles Fabricated by Using a Unique Laser Irradiation Method
Nonvolatile Memory Characteristics in Metal-Oxide-Semiconductors Containing Metal Nanoparticles Fabricated by Using a Unique Laser Irradiation Method
Jungyup Yang., | 한국물리학회 | 2006 ,
450
Piezoelectric Properties of Highly Oriented Lead-Free Na0.5K0.5NbO₃ Films as Determined Using Piezoelectric Force Microscopy
Piezoelectric Properties of Highly Oriented Lead-Free Na0.5K0.5NbO₃ Films as Determined Using Piezoelectric Force Microscopy
J.S. Kim., | 한국물리학회 | 2006 ,
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