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421
Fields Produced by Sources Stationary or Steady for a Finite Period
Fields Produced by Sources Stationary or Steady for a Finite Period
J.-M. Chung, | 한국물리학회 | 2006 ,
422
Observation of Complete Oxidation of InN to In₂O₃in Air at Elevated Temperatures by Using X-ray Photoemission Spectroscopy
Observation of Complete Oxidation of InN to In₂O₃in Air at Elevated Temperatures by Using X-ray Photoemission Spectroscopy
Ik Jae Lee, | 한국물리학회 | 2006 ,
423
DePendence of the Optical Trapping Efficiency of a Biconcave Red Blood Cell Flowing In a Rectangular Microchannel on the Sphericity Index and the Channel Geometry
DePendence of the Optical Trapping Efficiency of a Biconcave Red Blood Cell Flowing In a Rectangular Microchannel on the Sphericity Index and the Channel Geometry
Won Gu Lee, | 한국물리학회 | 2006 ,
424
Physical and Electrical Characteristics of Atomic-Layer-deposited Hf-Silicate Thin Films Using Hf[N(CH₃)(C₂H5)]₄and SiH[N(CH₃)₂]₃ Precursors
Physical and Electrical Characteristics of Atomic-Layer-deposited Hf-Silicate Thin Films Using Hf[N(CH₃)(C₂H5)]₄and SiH[N(CH₃)₂]₃ Precursors
K. B. Chung, | 한국물리학회 | 2006 ,
425
Time Resolved Photoluminescence Study on Silicon Nitride/Silicon-Rich-Oxide Superlattices Grown by Using Ion-Beam Sputtering Deposition
Time Resolved Photoluminescence Study on Silicon Nitride/Silicon-Rich-Oxide Superlattices Grown by Using Ion-Beam Sputtering Deposition
Kyu Man Cha, | 한국물리학회 | 2006 ,
426
A Parallel Plate Ionization Chamber for a Proton Beam Monitoring
A Parallel Plate Ionization Chamber for a Proton Beam Monitoring
Han Soo Kim, | 한국물리학회 | 2006 ,
427
Three Dimensional Shape Measurement of a Micro Fresnel Lens with In-line Phase-shifting Digital holographic Microscopy
Three Dimensional Shape Measurement of a Micro Fresnel Lens with In-line Phase-shifting Digital holographic Microscopy
Jeon Woong kang, | 한국광학회 | 2006 ,
428
Properties of the Ultra-Thin Silicon-Oxynitride Films Deposited by Using Plasma-Assisted N2O Oxidation for Semiconductor Device Applications
Properties of the Ultra-Thin Silicon-Oxynitride Films Deposited by Using Plasma-Assisted N2O Oxidation for Semiconductor Device Applications
Sunghyun Hwang, | 한국물리학회 | 2007 ,
429
Adsorption Effect of Silicon Sorption Artifacts by Using an Ultra-Precision Balance in Vacuum
Adsorption Effect of Silicon Sorption Artifacts by Using an Ultra-Precision Balance in Vacuum
Sungjun Lee, | 한국물리학회 | 2007 ,
430
Spectroscopic Ellipsometric Analysis of a Patterned Cr Film on Quartz
Spectroscopic Ellipsometric Analysis of a Patterned Cr Film on Quartz
S. Y. Lee, | 한국물리학회 | 2007 ,
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