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31
Essential Airline Service English
Essential Airline Service English
Cho, Young Shin, 326.39-C545e-관광 | Hanol | 2014 326.39-C545e-관광,
딸림정보
딸림정보
모체등록번호 딸림등록번호 서명 별치기호 자료상태 소장처
0294724 M004126 Essential Airline Service English CD 대출가능 문학자료실(관광학관1층)
0296557 M004120 Essential Airline Service English CD 대출가능 문학자료실(관광학관1층)
32
Study of SnO₂Nanorods Coated Using the PECVD Technique
Study of SnO₂Nanorods Coated Using the PECVD Technique
Hyoun Woo Kim, | 한국물리학회 | 2007 ,
33
Measurement of the Resonance Frequency, the Loss Factor, and the Dynamic Young's Modulus in Structural Steel and Polycarbonate by Using an Acoustic Velocity Sensor
Measurement of the Resonance Frequency, the Loss Factor, and the Dynamic Young's Modulus in Structural Steel and Polycarbonate by Using an Acoustic Velocity Sensor
Sung Soo Jung, | 한국물리학회 | 2006 ,
34
Femtosecond Pump-Probe MOKE Microscopy for an Ultrafast Spin Dynamics Study
Femtosecond Pump-Probe MOKE Microscopy for an Ultrafast Spin Dynamics Study
Kyeong-Dong Lee, | 한국물리학회 | 2006 ,
35
Temperature-Lowering-Induced Enhancement of Ballistic Transport in a 100-nm Γ-gate AlGaAs/InGaAs Pseudomorphic HEMT
Temperature-Lowering-Induced Enhancement of Ballistic Transport in a 100-nm Γ-gate AlGaAs/InGaAs Pseudomorphic HEMT
Nambin Kim, | 한국물리학회 | 2006 ,
36
Asymmetric Magnetoresistance in a Double Magnetic Barrier Device
Asymmetric Magnetoresistance in a Double Magnetic Barrier Device
Sungjung Joo, | 한국물리학회 | 2006 ,
37
Measurement and Visualization of Doping Profile in Silicon Using Kelvin Probe Force Microscopy (KPFM)
Measurement and Visualization of Doping Profile in Silicon Using Kelvin Probe Force Microscopy (KPFM)
Hyungjung Shin, | 대한금속재료학회 | 2005 ,
38
Camera Imaging Lens Fabrication using Wafer-Scale UV Embossing Process
Camera Imaging Lens Fabrication using Wafer-Scale UV Embossing Process
Ho-Seop Jeong, | 한국광학회 | 2006 ,
39
Asymmetric Magnetoresistance in a Double Magnetic Barrier Device
Asymmetric Magnetoresistance in a Double Magnetic Barrier Device
Joo, Sungjung, | 한국물리학회 | 2006 ,
40
Fabrication and Electrical Properties of Local Damascene FinFET Cell Array in Sub-60nm Feature Sized DRAM
Fabrication and Electrical Properties of Local Damascene FinFET Cell Array in Sub-60nm Feature Sized DRAM
Yong-Sung Kim., | 대한전자공학회 | 2006 ,
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