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371
수 중 존재하는 실리케이트의 존재형태가 불용성 알루미늄실리케이트 형성에 미치는 영향
수 중 존재하는 실리케이트의 존재형태가 불용성 알루미늄실리케이트 형성에 미치는 영향
권은미(Eun Mi Gwon),, | 대한환경공학회 | 2007 ,
372
Modeling And Multiresolution Analysis In a Full-Scale Industrial Plant
Modeling And Multiresolution Analysis In a Full-Scale Industrial Plant
Chang Kyoo Yoo, | 대한환경공학회 | 2005 ,
373
No Reduction Property of Pt-V₂O5-WO₃/TiO₂ Catalyst Supported On PRD-66 Ceramic Filter
No Reduction Property of Pt-V₂O5-WO₃/TiO₂ Catalyst Supported On PRD-66 Ceramic Filter
Young Ae Kim, | 대한환경공학회 | 2005 ,
374
Isolation, Identification And Characterization Of An Immobilized Bacterium Producing N₂ From NH₄(+) Under An Aerobic Condition
Isolation, Identification And Characterization Of An Immobilized Bacterium Producing N₂ From NH₄(+) Under An Aerobic Condition
Kyoung Joo Park, | 대한환경공학회 | 2005 ,
375
Photodissociation Dynamics of Formic Acid at 206 nm
Photodissociation Dynamics of Formic Acid at 206 nm
Tae Yeon Kang, | 대한화학회 | 2006 ,
376
Aggregation-Induced Emission Enhancement of Polysilole Nanoaggregates
Aggregation-Induced Emission Enhancement of Polysilole Nanoaggregates
Seunghyun Jang, | 대한화학회 | 2006 ,
377
Theoretical Calculation and Experimental Verification of the Hf/A1 Concentration Ratio in Nano-mixed HfxAlyOz Films Prepared by Atomic Layer Deposition
Theoretical Calculation and Experimental Verification of the Hf/A1 Concentration Ratio in Nano-mixed HfxAlyOz Films Prepared by Atomic Layer Deposition
Deok-Sin Kil, | 대한전자공학회 | 2005 ,
378
ViP: A Practical Approach to Platform-based System Modeling Methodology
ViP: A Practical Approach to Platform-based System Modeling Methodology
Junhyung Um, SungPack Hong, Young-Taek Kim, Eui-y, | 대한전자공학회 | 2005 ,
379
Optimum Design of the Interdigitated CB Structure
Optimum Design of the Interdigitated CB Structure
Yang Hong-qiang, | 대한전자공학회 | 2002 ,
380
Piezoelectric PZT Cantilever Array Integrated with Piezoresistor for High Speed Operation and Calibration of Atomic Force Microscopy
Piezoelectric PZT Cantilever Array Integrated with Piezoresistor for High Speed Operation and Calibration of Atomic Force Microscopy
Young-Sik Kim, | 대한전자공학회 | 2002 ,
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