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351
Ultrastructure of Mature Embryos in the Parasitic Flowering Plant Cuscuta japonica
Ultrastructure of Mature Embryos in the Parasitic Flowering Plant Cuscuta japonica
Kyu Bae Lee, | 한국식물학회(Adventitous Root Formation | 2006 ,
352
Rapid Upregulation of Dehyrin3 and Dehydrin4 in Response to Dehydration Is a Characteristic of Drought-Tolerant Genotypes in Barley
Rapid Upregulation of Dehyrin3 and Dehydrin4 in Response to Dehydration Is a Characteristic of Drought-Tolerant Genotypes in Barley
So Yon Park, | 한국식물학회(Adventitous Root Formation | 2006 ,
353
Enzymatic Properties of Fast - migrating Cationic Peroxidase Isozyme from Rice Callus
Enzymatic Properties of Fast - migrating Cationic Peroxidase Isozyme from Rice Callus
Kyung A Yoo, | 한국식물학회 | 2002 ,
354
The Study on the Characteristic of Phase Transition in Differential Thickness of Se1Sb2Se2 Thin Films
The Study on the Characteristic of Phase Transition in Differential Thickness of Se1Sb2Se2 Thin Films
Jae Min Lee, | 한국전기전자재료학회 | 2005 ,
355
The Phase Transition with Electric Field in Ternary Chalcogenide Thin Films
The Phase Transition with Electric Field in Ternary Chalcogenide Thin Films
Sung Jun Yang, | 한국전기전자재료학회 | 2005 ,
356
Effect of the Coating on the Structure and Optical Properties of GaN Nanowires
Effect of the Coating on the Structure and Optical Properties of GaN Nanowires
Jong Soo Lee, | 한국전기전자재료학회 | 2005 ,
357
Structural and Optoelectronic Properties of SnO2 Nanowires
Structural and Optoelectronic Properties of SnO2 Nanowires
Jong Soo Lee, | 한국전기전자재료학회 | 2005 ,
358
Circuit Modeling of 3-D Parallel-plate Capacitors Fabricated by LTCC Process
Circuit Modeling of 3-D Parallel-plate Capacitors Fabricated by LTCC Process
Dong Wook Shin, | 한국전기전자재료학회 | 2005 ,
359
The Study of Phase-change with Temperature and Electric field in Chalcogenide Thin Film
The Study of Phase-change with Temperature and Electric field in Chalcogenide Thin Film
Sung Jun Yang, | 한국전기전자재료학회 | 2004 ,
360
Thermal Stability and Electrical Properties of HfOxNy, Gate Dielectrics with TaN Gate Electrode
Thermal Stability and Electrical Properties of HfOxNy, Gate Dielectrics with TaN Gate Electrode
Jeon Ho Kim, | 한국전기전자재료학회 | 2004 ,
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