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486 Results:AA:C H OH 0.718 sec.
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311
Influence of High Temperature Annealing on the Magnetic and the Structural Properties of Co Ion-Implanted ZnO Single Crystals
Influence of High Temperature Annealing on the Magnetic and the Structural Properties of Co Ion-Implanted ZnO Single Crystals
Woochul Kim, | 한국물리학회 | 2006 ,
312
Anisotropic X-ray Rocking Curve Due to a Damaged Surface Layer in a Freestanding GaN Thick Film
Anisotropic X-ray Rocking Curve Due to a Damaged Surface Layer in a Freestanding GaN Thick Film
S. H. Park, | 한국물리학회 | 2006 ,
313
Structural Properties of CrN Buffers for GaN Growth
Structural Properties of CrN Buffers for GaN Growth
W. H. Lee, | 한국물리학회 | 2006 ,
314
Roles of Kinetics and Energetics in the Growth of AIN by Plasma-Assisted Molecular Beam Epitaxy
Roles of Kinetics and Energetics in the Growth of AIN by Plasma-Assisted Molecular Beam Epitaxy
I. H. Im, | 한국물리학회 | 2006 ,
315
Characteristics of Hydrogen Storage Alloy p-GaN Ohmic Contacts for InGaN LEDs
Characteristics of Hydrogen Storage Alloy p-GaN Ohmic Contacts for InGaN LEDs
Seung Wan Chae, | 한국물리학회 | 2006 ,
316
Effects of the Surface Relief Profile on Liqued Crystal Aligning Capabilities of Laser-Induced Periodic Surface Structures
Effects of the Surface Relief Profile on Liqued Crystal Aligning Capabilities of Laser-Induced Periodic Surface Structures
Jong Jin Lee, | 한국물리학회 | 2006 ,
317
Characterization of MBE-Grown ZnSe Thin Films by Using Photocurrent Spectroscopy
Characterization of MBE-Grown ZnSe Thin Films by Using Photocurrent Spectroscopy
M. H. Jung, | 한국물리학회 | 2006 ,
318
Mask Error Enhancement Factor Variation With Pattern Density for 65 nm and 90 nm Line Widths
Mask Error Enhancement Factor Variation With Pattern Density for 65 nm and 90 nm Line Widths
Hye-Young Kang, | 한국물리학회 | 2006 ,
319
Improvement of Column Spzcer Uniformity in a TFT LCD Panel
Improvement of Column Spzcer Uniformity in a TFT LCD Panel
Jung-Hyuk Cho, | 한국물리학회 | 2006 ,
320
Correlation Between Yellow Emission and Misoriented Structure in GaN Epilayers
Correlation Between Yellow Emission and Misoriented Structure in GaN Epilayers
O. H. Cha, | 한국물리학회 | 2006 ,
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