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21
Likelihood Based Confidence Intervals for the Common Scale Parameter in the Inverse Gaussian Distributions
Likelihood Based Confidence Intervals for the Common Scale Parameter in the Inverse Gaussian Distributions
Lee Woo Dong, | 한국데이터정보과학회 | 2006 ,
22
Estimation for the Rayleigh Distribution with Known Parameter under Multiply Type-II Censoring
Estimation for the Rayleigh Distribution with Known Parameter under Multiply Type-II Censoring
Han Jun-Tae, | 한국데이터정보과학회 | 2006 ,
23
The Fractional Bayes Factor Approach to the Bayesian Testing of the Weibull Shape Parameter
The Fractional Bayes Factor Approach to the Bayesian Testing of the Weibull Shape Parameter
Cha Young Joon, | 한국데이터정보과학회 | 2006 ,
24
Estimation in Mixture of Shifted Poisson Distributions with Known Shift Parameters
Estimation in Mixture of Shifted Poisson Distributions with Known Shift Parameters
Lee Hyun Jung, | 한국데이터정보과학회 | 2006 ,
25
The UMVUE of [P(Y>X)]k in a Two Parameter Exponential Distribution
The UMVUE of [P(Y>X)]k in a Two Parameter Exponential Distribution
Kim Joogdae, | 한국데이터정보과학회 | 2006 ,
26
Reducing Bias of the Minimum Hellinger Distance Estimator of a Location Parameter
Reducing Bias of the Minimum Hellinger Distance Estimator of a Location Parameter
Pak, Ro Jin, | 한국데이터정보과학회 | 2006 ,
27
Concrete stress block parameters for high-strength concrete : Recent developments and their impact
Concrete stress block parameters for high-strength concrete : Recent developments and their impact
Bae Sungjin, | 한국콘크리트학회 | 2006 ,
28
Electrical Characteristics of CMOS Corcuit Due to Channel Region Parameters in LDMOSFET
Electrical Characteristics of CMOS Corcuit Due to Channel Region Parameters in LDMOSFET
Nam-Soo Kim, | 한국전기전자재료학회 | 2006 ,
29
Optimal scheduling of detection and tracking parameters in phased array radars
Optimal scheduling of detection and tracking parameters in phased array radars
Jung Young Hun, 568.55-J95o-TD | Kyungpook National University | 1998 568.55-J95o-TD,
30
Analysis of Process Parameters to Improve On-Chip Linewidth Variation
Analysis of Process Parameters to Improve On-Chip Linewidth Variation
Yun-Kyeong Jang, Doo-Youl Lee, Sung-Woo Lee, | 대한전자공학회 | 2004 ,
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