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21
Low Voltage Program/ Erase Characteristics of Si Nanocrystal Memory with Damascene Gate FinFET on Bulk Si Wafer
Low Voltage Program/ Erase Characteristics of Si Nanocrystal Memory with Damascene Gate FinFET on Bulk Si Wafer
Jeong-Dong Choe., | 대한전자공학회 | 2006 ,
22
Emission Characteristics of PCDDs/PCDFs from ferrous metal foundries
Emission Characteristics of PCDDs/PCDFs from ferrous metal foundries
Sam-Cwan Kim, | 한국환경분석학회 | 2005 ,
23
Emission characteristics of PCDDs/PCDFs from nonferrous metal foundry
Emission characteristics of PCDDs/PCDFs from nonferrous metal foundry
Sam-Cwan Kim, | 한국환경분석학회 | 2005 ,
24
Fabrication of a Probe Needle using a Tubular Cathode by Electrochemical Etching
Fabrication of a Probe Needle using a Tubular Cathode by Electrochemical Etching
Jae Wong Choi, Gil Ho Hwang, Sung Goon Kang, | Korean Institute of Metals and Materials | 2006 ,
25
Pre-Annealing Effect of Electroless Ni-B Deposit as a Diffusion Barrier for Electroplated Cu Electrodes
Pre-Annealing Effect of Electroless Ni-B Deposit as a Diffusion Barrier for Electroplated Cu Electrodes
Jae Woong Choi, Gil Ho Hwang, Won Kyu Han, Sung G, | Korean Institute of Metals and Materials | 2006 ,
26
Round Robin Analysis for Probabilistic Structural Integrity of Reactor Pressure Vessel under Pressurized Thermal Shock
Round Robin Analysis for Probabilistic Structural Integrity of Reactor Pressure Vessel under Pressurized Thermal Shock
Myung Jo Jhung, Changheui Jang, Seok Hun Kim, You, | 대한기계학회 | 2005 ,
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