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201
Expression of Tobacco cDNA Encoding Phytochelatin Synthase Promotes Tolerance to and Accumulation of Cd and As in Saccharomyces cerevisiae
Expression of Tobacco cDNA Encoding Phytochelatin Synthase Promotes Tolerance to and Accumulation of Cd and As in Saccharomyces cerevisiae
Young Jin Kim, | 한국식물학회(Adventitous Root Formation | 2005 ,
202
Light Quality Affects in Vitro Growth of Grape "Teleki 5BB"
Light Quality Affects in Vitro Growth of Grape "Teleki 5BB"
Jeong Wook Heo, | 한국식물학회(Adventitous Root Formation | 2006 ,
203
Identification and Characterization of Highly Expressed Genes in Suspension-Cultured Cells of Sweet Potato
Identification and Characterization of Highly Expressed Genes in Suspension-Cultured Cells of Sweet Potato
Young Hwa Kim, | 한국식물학회(Adventitous Root Formation | 2006 ,
204
Determination of Self-Incompatibility Genotypes of Korean Apple Cultivars Based on S-RNase PCR
Determination of Self-Incompatibility Genotypes of Korean Apple Cultivars Based on S-RNase PCR
Hoy Taek Kim, | 한국식물학회(Adventitous Root Formation | 2006 ,
205
Speaking Anxiety of Three Korean Graduate Students in the American Academic Setting
Speaking Anxiety of Three Korean Graduate Students in the American Academic Setting
Shin-hye Kim, | 한국영미어문학회 | 2001 ,
206
RF Bias Effect of ITO Thin Films Reactively Sputtered on PET Substrates at Room Temperature
RF Bias Effect of ITO Thin Films Reactively Sputtered on PET Substrates at Room Temperature
Hyun Hoo Kim, | 한국전기전자재료학회 | 2005 ,
207
Factors Affecting Efficiency of Shoot Induction in Citrus junos Sieb.
Factors Affecting Efficiency of Shoot Induction in Citrus junos Sieb.
Mi-Hye Kim, | 한국식물학회 | 2001 ,
208
Circuit Modeling of 3-D Parallel-plate Capacitors Fabricated by LTCC Process
Circuit Modeling of 3-D Parallel-plate Capacitors Fabricated by LTCC Process
Dong Wook Shin, | 한국전기전자재료학회 | 2005 ,
209
Time-Resolved Photoluminescence Measurement of Frenkeltype Excitonic Lifetimes in InGaN/GaN Multi-quantum Well Structures
Time-Resolved Photoluminescence Measurement of Frenkeltype Excitonic Lifetimes in InGaN/GaN Multi-quantum Well Structures
Gwi Su Shin, | 한국전기전자재료학회 | 2004 ,
210
Thermal Stability and Electrical Properties of HfOxNy, Gate Dielectrics with TaN Gate Electrode
Thermal Stability and Electrical Properties of HfOxNy, Gate Dielectrics with TaN Gate Electrode
Jeon Ho Kim, | 한국전기전자재료학회 | 2004 ,
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