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11
Low Voltage Program/ Erase Characteristics of Si Nanocrystal Memory with Damascene Gate FinFET on Bulk Si Wafer
Low Voltage Program/ Erase Characteristics of Si Nanocrystal Memory with Damascene Gate FinFET on Bulk Si Wafer
Jeong-Dong Choe., | 대한전자공학회 | 2006 ,
12
AZO films prepared by facing target sputtering systems
AZO films prepared by facing target sputtering systems
Kim, Kyung-Hwan, | 한국전기전자재료학회 | 2007 ,
13
The disigning of an Air-gap type FBAR filter using leach equivalent model
The disigning of an Air-gap type FBAR filter using leach equivalent model
Choi, Hyung-Wook, | 한국전기전자재료학회 | 2007 ,
14
Cycle Resolved NO Emissions and Its Relation with Combustion Chamber Pressure in an S. I. Engine with Fast Response NO Analyzer
Cycle Resolved NO Emissions and Its Relation with Combustion Chamber Pressure in an S. I. Engine with Fast Response NO Analyzer
Jung-MIn Sung,Hyun-Woo Kim,Kyung-Hwan Lee, | 대한기계학회 | 2003 ,
15
(A)Cross-cultural decriptive study of the perceptions of computer-based property management systems by hotel managers and employees in korea and the U.S.A.
(A)Cross-cultural decriptive study of the perceptions of computer-based property management systems by hotel managers and employees in korea and the U.S.A.
Kim, Kyung Hwan, 591.9525-K49c-TM | Florada international university | 1994 591.9525-K49c-TM,
16
Department of successful acquisition management : A Process perspective in the Lodging industy
Department of successful acquisition management : A Process perspective in the Lodging industy
Kim, Kyung-Hwan, 326.39-K49d-TM | Virginia Polytechnic Institute and State University | 1998 326.39-K49d-TM,
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