본문

  1. Home
21 Results:AA:HYUNG DAE KIM 0.208 sec.
RSS 
Multilingual
 חיפוש מתקדם
 חיפוש חדש ההגעה
Selected Print Select Export to Excel
11
Aggregation-Induced Emission Enhancement of Polysilole Nanoaggregates
Aggregation-Induced Emission Enhancement of Polysilole Nanoaggregates
Seunghyun Jang, | 대한화학회 | 2006 ,
12
Quick Phase Search Mehod on an Adsorbed System
Quick Phase Search Mehod on an Adsorbed System
Dae-Hwnag Yoo, | 한국물리학회 | 2007 ,
13
Growth Dynamics and Size Distribution of Self-Assembled ZnO Nanocrystals on a Metal Pt(111) Substrate
Growth Dynamics and Size Distribution of Self-Assembled ZnO Nanocrystals on a Metal Pt(111) Substrate
Tae-Bong Hur, | 한국물리학회 | 2007 ,
14
A Study of the Structure in a ZnO/MgO Multilayer by Using a Synchrotron X-ray Scattering Method
A Study of the Structure in a ZnO/MgO Multilayer by Using a Synchrotron X-ray Scattering Method
Jae Hyung Jo, | 한국물리학회 | 2007 ,
15
Alternating Current(AC) Corrosion Analyzed by Electrochemical Impedance Spectroscopy
Alternating Current(AC) Corrosion Analyzed by Electrochemical Impedance Spectroscopy
TaeHyun Ha, | 한국부식학회(현)한국부식방식학회 | 2002 ,
16
BEM Analysis for Cathodic Protection Design of Pier
BEM Analysis for Cathodic Protection Design of Pier
HyunGoo Lee, | 한국부식학회(현)한국부식방식학회 | 2002 ,
17
Experimental Study of Heating Surface Angle Effects on Single Bubble Growth
Experimental Study of Heating Surface Angle Effects on Single Bubble Growth
Jeongbae Kim., | 대한기계학회 | 2006 ,
18
Effect of particle size of ceria coated silica and polishing pressure on chemical mechanical polishing of oxide film
Effect of particle size of ceria coated silica and polishing pressure on chemical mechanical polishing of oxide film
Kim, Hwan-Chul, | 한국전기전자재료학회 | 2007 ,
19
Accurate Extraction of Crosstalk Induced Dynamic Variation of Coupling Capacitance for Interconnect Lines of CMOSFETs
Accurate Extraction of Crosstalk Induced Dynamic Variation of Coupling Capacitance for Interconnect Lines of CMOSFETs
Yong Goo-Kim, Hee-Hwan Ji, Hyung Sun Yoon, Sung H, | 대한전자공학회 | 2004 ,
20
LC Aligning Properties for Homeotropic Alignment of NLC on the SiOх Thin Film as Incident Angle of Electron Beam Evaporation Angle
LC Aligning Properties for Homeotropic Alignment of NLC on the SiOх Thin Film as Incident Angle of Electron Beam Evaporation Angle
Jong-Hwan Kim, | 한국전기전자재료학회 | 2007 ,
처음이전123이후마지막