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Arifacts in Sample Preparatoin of Trasmission Electron Microscopy
Arifacts in Sample Preparatoin of Trasmission Electron Microscopy
Youn-Woon Kim, | 대한금속.재료학회 | 2001 ,
12
High-Resolution Transmission Electron Microscopy and Associated Techniques
High-Resolution Transmission Electron Microscopy and Associated Techniques
Buseck, Peter, 478.1-B977h | Oxford University | 1988 478.1-B977h,
처음이전12마지막
1
Journal of Microscopy
Blackwell Publishing Limited [, ]
2
Probe Microscopy
Taylor & Francis Ltd [, ]