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174 Results:AA:BONG G KIM 0.187 sec.
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111
Coarsening Dynamics in a Two-Dimensional XY Model with Hamiltonian Dynamics
Coarsening Dynamics in a Two-Dimensional XY Model with Hamiltonian Dynamics
Kyo-Joon Koo, | 한국물리학회 | 2006 ,
112
Measurement of the Resonance Frequency, the Loss Factor, and the Dynamic Young's Modulus in Structural Steel and Polycarbonate by Using an Acoustic Velocity Sensor
Measurement of the Resonance Frequency, the Loss Factor, and the Dynamic Young's Modulus in Structural Steel and Polycarbonate by Using an Acoustic Velocity Sensor
Sung Soo Jung, | 한국물리학회 | 2006 ,
113
Development of a TWwo-Dimensional Nano-Displacement Measuring System Utilizing a 2D Combined Optical and X-ray Interferometer
Development of a TWwo-Dimensional Nano-Displacement Measuring System Utilizing a 2D Combined Optical and X-ray Interferometer
Jinwon Park, | 한국물리학회 | 2006 ,
114
Negative-Ion Mass Spectrometric Study of Ion-Pair Formation from Photoexcited 1, 1-Difluoroethene in the Range of 12.4~31.0 eV
Negative-Ion Mass Spectrometric Study of Ion-Pair Formation from Photoexcited 1, 1-Difluoroethene in the Range of 12.4~31.0 eV
Bong Hyun Boo, | 한국물리학회 | 2007 ,
115
RF Discharge in the KSTAR ICRF Antenna
RF Discharge in the KSTAR ICRF Antenna
Young-Dug Bae, | 한국물리학회 | 2007 ,
116
Wall-Controlled Growth of CNTs for X-ray Electron Sources
Wall-Controlled Growth of CNTs for X-ray Electron Sources
Chang-Duk Kim, | 한국물리학회 | 2007 ,
117
Image Quality Evaluation of a Highly-Integrated Digital X-ray Imaging Sensor for Dental Intraoral-Imaging Applications
Image Quality Evaluation of a Highly-Integrated Digital X-ray Imaging Sensor for Dental Intraoral-Imaging Applications
Hyosung Cho, | 한국물리학회 | 2007 ,
118
Teragertz Generation in Quasi-Phase-Matching Structures Using Femtosecond Laser Pulses
Teragertz Generation in Quasi-Phase-Matching Structures Using Femtosecond Laser Pulses
Nan Ei Yu, | 한국물리학회 | 2007 ,
119
Source Identification and Quantification of Coarse and Fine Particles by TTFA and PMF
Source Identification and Quantification of Coarse and Fine Particles by TTFA and PMF
In-Jo Hwang, | 한국대기환경학회 | 2002 ,
120
Measurement and Visualization of Doping Profile in Silicon Using Kelvin Probe Force Microscopy (KPFM)
Measurement and Visualization of Doping Profile in Silicon Using Kelvin Probe Force Microscopy (KPFM)
Hyungjung Shin, | 대한금속재료학회 | 2005 ,
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