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1
Structural Characteristics of SiGe/Si Materials Investigated by Raman Spectroscopy
Structural Characteristics of SiGe/Si Materials Investigated by Raman Spectroscopy
ChangChun Chen, | 대한금속재료학회 | 2005 ,
2
Composition Determination of Si/Sil-xGex/Si by Photoreflectance Spectroscopy
Composition Determination of Si/Sil-xGex/Si by Photoreflectance Spectroscopy
Changchun Chen, P.V. Kelly, Zhihong Liu, | 대한금속.재료학회 | 2004 ,
3
Growth of SiGe Film By Using A Single-wafer Rapid Thermal Processing UHV/CVD System
Growth of SiGe Film By Using A Single-wafer Rapid Thermal Processing UHV/CVD System
Wentao Huang, Changchun Chen, Xiyou Li, | 대한금속.재료학회 | 2004 ,
4
A Study on the Strain Stability of Si/SiGe Layer Structure in a Heterojunction Bipolar Transistor during Thermal Processing
A Study on the Strain Stability of Si/SiGe Layer Structure in a Heterojunction Bipolar Transistor during Thermal Processing
Zhihong Liu, Changchun Chen, Wentao Huang, | 대한금속.재료학회 | 2004 ,
5
High Quality Partially Relaxed SiGe Film Grown on Silicon-on-Insulator Substrate by Ultra-High Vacuum Chemical Vapor Deposition
High Quality Partially Relaxed SiGe Film Grown on Silicon-on-Insulator Substrate by Ultra-High Vacuum Chemical Vapor Deposition
Changchun Chen, Wentao Huang, Zhihiog Liu, | 대한금속.재료학회 | 2004 ,
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