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Thickness Dependence of the Electrical Properties in NiCr Thin Film Fesistors Annealed in a Vacuum Ambient for π-type Attenuator Applications
Thickness Dependence of the Electrical Properties in NiCr Thin Film Fesistors Annealed in a Vacuum Ambient for π-type Attenuator Applications
Nguyen Mai Phuong, | 한국전기전자재료학회 | 2006 ,
처음1마지막
1
Journal of Korean Vacuum Science & Technology
한국진공학회 [자연과학, ]
2
Journal of Korean Vacuum Science & Technology
한국진공학회 [, ]
3
United States v. Socony-Vacuum Oil Co.
Great Neck Publishing [, ]