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Thickness Dependence of the Electrical Properties in NiCr Thin Film Fesistors Annealed in a Vacuum Ambient for π-type Attenuator Applications
Thickness Dependence of the Electrical Properties in NiCr Thin Film Fesistors Annealed in a Vacuum Ambient for π-type Attenuator Applications
Nguyen Mai Phuong, | 한국전기전자재료학회 | 2006 ,
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