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1
Design of a Cylindrical Flexure Jointed Stewart Platform for Aligning the Condenser in an X-ray Microscope
Design of a Cylindrical Flexure Jointed Stewart Platform for Aligning the Condenser in an X-ray Microscope
Sung-hoon Kang., | 한국정밀공학회 | 2006 ,
2
Nonlinear Thomson Scattering for Attosecond X-ray Pulse Generation
Nonlinear Thomson Scattering for Attosecond X-ray Pulse Generation
Lee, Kitae, | 한국물리학회 | 2006 ,
3
Development of a Two-Dimensional Nano-Displacement Measuring System Utilizing a 2D Combined Optical and X-ray Interferometer
Development of a Two-Dimensional Nano-Displacement Measuring System Utilizing a 2D Combined Optical and X-ray Interferometer
Park, Jinwon, | 한국물리학회 | 2006 ,
4
Comparison of effective dose to children and adults from dual X-ray absorptiometry examinations
Comparison of effective dose to children and adults from dual X-ray absorptiometry examinations
Glen M. Blake., | Elsevier Inc | 2006 ,
5
Non-destructive studies of tissue-engineered phalanges by magnetic resonance microscopy and X-ray microtomography
Non-destructive studies of tissue-engineered phalanges by magnetic resonance microscopy and X-ray microtomography
Kimberlle Potter., | Elsevier Inc | 2006 ,
6
X-ray Structure and Alkyl Ammonium Recognition of Quadruply Bridged Calix[6]arene : A Selective Inclusion of Primary Alkyl Ammonium with Calix[6]arene
X-ray Structure and Alkyl Ammonium Recognition of Quadruply Bridged Calix[6]arene : A Selective Inclusion of Primary Alkyl Ammonium with Calix[6]arene
Lee Young Ju, | 대한화학회 | 2006 ,
7
Proton-Induced X-Ray Emission (PIXE) Characterizatio ofSpecial Glasses and Multi-Coated Lenses
Proton-Induced X-Ray Emission (PIXE) Characterizatio ofSpecial Glasses and Multi-Coated Lenses
Y.H.Han,T.A.Cahill.S.J.Kim, | 대한금속.재료학회 | 2001 ,
8
X-Ray Binaries
X-Ray Binaries
Lewin, Walter H. G., 443.8-L672x | Cambridge University Press | 1995 443.8-L672x,
9
Advances in X-Ray Analysis, 27.
Advances in X-Ray Analysis, 27.
Cohen, Jerome B, 512.151-C678a | Plenum | 1984 512.151-C678a,
10
The basics of crystallography anddiffraction
The basics of crystallography anddiffraction
Hammond, Christopher., 429.32-H225b | International Union of Crystallography:Oxford University Press | 1997 429.32-H225b,
처음1마지막
1
Journal of X-Ray Science & Technology
IOS Press [, ]