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1
Fault Detection, Diagnosis, and Optimization of Wafer Manufacturing Processes utilizing Knowledge Creation
Fault Detection, Diagnosis, and Optimization of Wafer Manufacturing Processes utilizing Knowledge Creation
Hyeon Bae, | 제어자동화시스템공학회 | 2006 ,
2
Development of a Two-Dimensional Nano-Displacement Measuring System Utilizing a 2D Combined Optical and X-ray Interferometer
Development of a Two-Dimensional Nano-Displacement Measuring System Utilizing a 2D Combined Optical and X-ray Interferometer
Park, Jinwon, | 한국물리학회 | 2006 ,
3
Removal of Colloidal Particles Utilizing Gelation Reaction of Sodium Alginate
Removal of Colloidal Particles Utilizing Gelation Reaction of Sodium Alginate
Masashi Iwata, | 한국화학공학회 | 2000 ,
4
Utilizing Principal Component Analysis in Unsupervised Classification
Utilizing Principal Component Analysis in Unsupervised Classification
Byung-Gul Lee,In-Joon Kang,Thomas M Lillesand, | 대한토목학회 | 2003 ,
5
A Study on Feature-Based Visual Servoing Control of Robot System by Utilizing Redundant Feature
A Study on Feature-Based Visual Servoing Control of Robot System by Utilizing Redundant Feature
Sung Hyun Han,Hideki Hashimoto, | 대한기계학회 | 2002 ,
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