신경주학교 도서관

11 Results:SS:MICROSCOPY 0.124 sec.

Confocal Scanning Microscopy : a High-Resolution nondestructive Surface Profiler
Hongki Yoo., | 한국정밀공학회 | 2006 ,

Immobilization and Observation of Particles with 3-Aminopropyltrimethoxysilane Studied by Scanning Probe Microscopy
Y. J. Oh., | 한국물리학회 | 2006 ,

Piezoelectric Properties of Highly Oriented Lead-Free Na0.5K0.5NbO₃ Films as Determined Using Piezoelectric Force Microscopy
J.S. Kim., | 한국물리학회 | 2006 ,

Amorphous-Like Interfacial Layer Between a High-Tc Superconducting Tl-1223 Film and a Ag Substrate Examined by High-Voltage High-Resolution Transmission Electron Microscopy
Bong-jun Kim., | 한국물리학회 | 2006 ,

g Nonlinear Dielectric Microscopy를 이용한 저항 탐침 형성 고정 최적화를 위한 단면 채널 구조 관찰
김찬형, | 대한금속재료학회 | 2006 ,

Quantiative scanning acoustic microscopy compared to microradiography for assessment of new bone formation
Markus Regauer, | Elsevier Inc | 2006 ,

Non-destructive studies of tissue-engineered phalanges by magnetic resonance microscopy and X-ray microtomography
Kimberlle Potter., | Elsevier Inc | 2006 ,

A Scanning Tunneling Microscopy Tip with a Sable Atomic Structure
Yeong-Cheol Kim, and David N. Seidman, | 대한금속.재료학회 | 2004 ,

An Electrochemical Etching Procedure for Fabricating Scanning Tunneling Microscopy and Atom-Probe Field-Ion Microscopy Tips
Yeong-Cheol Kim,David N Seidman, | 대한금속.재료학회 | 2003 ,

Arifacts in Sample Preparatoin of Trasmission Electron Microscopy
Youn-Woon Kim, | 대한금속.재료학회 | 2001 ,

Journal of Microscopy
Blackwell Publishing Limited [, ]

Probe Microscopy
Taylor & Francis Ltd [, ]