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Trade-off Characteristic between Gate Length Margin and Hot Carrier Lifetime by Considering ESD on NMOSFETs of Submicron Technology
Trade-off Characteristic between Gate Length Margin and Hot Carrier Lifetime by Considering ESD on NMOSFETs of Submicron Technology
Bong-Kyu Joung, | 한국전기전자재료학회 | 2007 ,
처음1마지막
1
Annual Report to Congress: The Military Power of the People's Republic of China 2005
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2
Anuario Filosofico
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Diabetes Dateline
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Mobility Forum: The Journal of the Air Mobility Command's Magazine
United States Department of Defense [, ]
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My Confession (Atrocities During the Mexican/American War)
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Scientific Papers: Series D, Animal Science - The International Session of Scientific Communications of the Faculty of Animal Science
University of Agricultural Sciences & Veterinary Medicine, Faculty of Animal Science [, ]
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Strategy for Homeland Defense & Civil Support
United States Department of Defense [, ]