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4 Results:AA:SAXENA G PP:대한전자공학회 0.39 sec.
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1
Physics-based Algorithm Implementation for Characterization of Gate-dielectric Engineered MOSFETs including Quantization Effects
Physics-based Algorithm Implementation for Characterization of Gate-dielectric Engineered MOSFETs including Quantization Effects
Tina Mangla, | 대한전자공학회 | 2005 ,
2
Physics-based Algorithm Implementation for Characterization of Gate-dielectric Engineered MOSFETs including Quantization Effects
Physics-based Algorithm Implementation for Characterization of Gate-dielectric Engineered MOSFETs including Quantization Effects
Tina Mangla, | 대한전자공학회 | 2002 ,
3
Optimization of Gate Stack MOSFETs with Quantization Effect
Optimization of Gate Stack MOSFETs with Quantization Effect
Tina Mangla, | 대한전자공학회 | 2004 ,
4
A Novel Test Structure for Process Control Monitor for Un-Cooled Bolometer Area Array Detector Technology
A Novel Test Structure for Process Control Monitor for Un-Cooled Bolometer Area Array Detector Technology
R. S. Saxena., | 대한전자공학회 | 2006 ,
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