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1
Trade-off Characteristic between Gate Length Margin and Hot Carrier Lifetime by Considering ESD on NMOSFETs of Submicron Technology
Trade-off Characteristic between Gate Length Margin and Hot Carrier Lifetime by Considering ESD on NMOSFETs of Submicron Technology
Bong-Kyu Joung, | 한국전기전자재료학회 | 2007 ,
처음1마지막
1
Advanced and Future Microelectronics Workshop - Advanced Packaging Technology -
대한전자공학회 [공학, ]
2
Advanced and Future Microelectronics Workshop - Advanced Packaging Technology -
대한전자공학회 [, ]
3
Advanced Powder Technology
VSP International Science Publishers [, ]
4
Adweek Magazines' Technology Marketing
VNU eMedia, Inc. [, ]
5
American Journal of Electroneurodiagnostic Technology
American Society of Electroneurodiagnostic Technologists [, ]
6
American Journal of Electroneurodiagnostic Technology
American Society of Electroneurodiagnostic Technologists [, ]
7
Animal Biotechnology
Marcel Dekker Inc. [, ]
8
Applied Microbiology & Biotechnology
Kluwer Academic Publishing / Academic [, ]
9
Applied Science and Convergence Technology
한국진공학회 [자연과학, ]
10
Artificial Cells, Blood Substitutes & Biotechnology
Marcel Dekker Inc. [, ]
11
Artificial Cells, Blood Substitutes, & Immobilization Biotechnology
Marcel Dekker Inc. [, ]
12
Assistive Technology
Rehabilitation Engineering & Assistive Technology Society of North America [, ]
13
Aviation Week & Space Technology
McGraw-Hill Companies, Inc. [, ]
14
Behavioral Technology Today
Cambridge Center for Behavioral Studies [, ]
15
Behaviour & Information Technology
Taylor & Francis Ltd [, ]
16
Berkeley Technology Law Journal
University of California School of Law [, ]
17
Biomedical Instrumentation & Technology
Alliance Communications Group [, ]
18
BMC Biotechnology
BioMed Central [, ]
19
British Journal of Educational Technology
Blackwell Publishing Limited [, ]
20
Bulletin of Good Practice in Popular Education
University of Technology, Sydney [, ]