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81
Flexble Docking Mechanism with Error-Compensation Capability for Auto Recharging System of Mobile Robot
Flexble Docking Mechanism with Error-Compensation Capability for Auto Recharging System of Mobile Robot
Se-gon Roh, | 제어자동화시스템공학회 | 2008 ,
82
Soil Erosion Modeling Using Rusle and Gis on the IMHA Waterhed
Soil Erosion Modeling Using Rusle and Gis on the IMHA Waterhed
Hyeon Sik Kim, | 한국수자원학회 | 2006 ,
83
Development of a CCD-Scintillator Device and a Multi -Layer Faraday Cup for Therapeutic Proton Beam Monitoring
Development of a CCD-Scintillator Device and a Multi -Layer Faraday Cup for Therapeutic Proton Beam Monitoring
Jeong Wan Kwon, | 한국물리학회 | 2006 ,
84
Error Analysis of the Pefp RFQ
Error Analysis of the Pefp RFQ
Hyeok Jung Kwon, | 한국물리학회 | 2006 ,
85
Effects of Be-Codoping on the Properties of GaMnAs Films Grown via Low-Temperature Molecular Beam Epitaxy
Effects of Be-Codoping on the Properties of GaMnAs Films Grown via Low-Temperature Molecular Beam Epitaxy
Fucheng Yu., | 한국물리학회 | 2006 ,
86
Bending Effects of Indium-Zinc Oxide Thin Films Deposited on Polyethylene Terephthalate Substrate by Radio Frequency Magnetron Sputtering
Bending Effects of Indium-Zinc Oxide Thin Films Deposited on Polyethylene Terephthalate Substrate by Radio Frequency Magnetron Sputtering
J.M. Park., | 한국물리학회 | 2006 ,
87
Narrow Band Electroabsorption Modulator Modules for a 60-GHz Radio-Over-Fiber Link
Narrow Band Electroabsorption Modulator Modules for a 60-GHz Radio-Over-Fiber Link
Yong-duck Chung., | 한국물리학회 | 2006 ,
88
Bit Error Rate Measurement of an RSFQ Roggle Flip-Flop
Bit Error Rate Measurement of an RSFQ Roggle Flip-Flop
Sehoon Kim., | 한국물리학회 | 2006 ,
89
Large-Mode-Area Index-Guiding Holey Fibers with Ultra-Low Ultra-Flattened Dispersion Using a Novel Hollow-Ring Defect Structure
Large-Mode-Area Index-Guiding Holey Fibers with Ultra-Low Ultra-Flattened Dispersion Using a Novel Hollow-Ring Defect Structure
Soan Kim., | 한국물리학회 | 2006 ,
90
Mask Error Enhancement Factor Variation with Pattern Density for 65 nm and 90 nm Line Widths
Mask Error Enhancement Factor Variation with Pattern Density for 65 nm and 90 nm Line Widths
Kang, Hye-young, | 한국물리학회 | 2006 ,
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