본문

  1. Home
1000 Results:AA:C S KIM 0.406 sec.
RSS 
다국어입력
 상세검색
 신착검색
선택출력 선택엑셀내보내기
791
Integration of a Passive-Type UHF RFID Tag Using Ferroelectric Memory Technology
Integration of a Passive-Type UHF RFID Tag Using Ferroelectric Memory Technology
Hae-Chan Park, | 한국물리학회 | 2007 ,
792
Effects of Annealing on the Electrical Properties of the BLT/STA/Si Structure for Ferroelectric-Gate Field-Effect Transistors
Effects of Annealing on the Electrical Properties of the BLT/STA/Si Structure for Ferroelectric-Gate Field-Effect Transistors
Ho-sung Jeon, | 한국물리학회 | 2007 ,
793
Fabrication and Electrical Properties of Au/Bi3.35La0.75Ti₃O12/ZrO₂/Si Structure
Fabrication and Electrical Properties of Au/Bi3.35La0.75Ti₃O12/ZrO₂/Si Structure
Jun-Seo Park, | 한국물리학회 | 2007 ,
794
Effects of a PbTiO₃ Seed Layer on the Structural and the Electrical Properties of PbZr0.35Ti0.65O₃Thin Films
Effects of a PbTiO₃ Seed Layer on the Structural and the Electrical Properties of PbZr0.35Ti0.65O₃Thin Films
Young-Jin Son, | 한국물리학회 | 2007 ,
795
Ferroelectric and Relaxor Behavior of Fe-Doped Sr0.5Ba0.5Nb₂_xFeχO6 Ceramics with a Tungsten-Bronze Structure
Ferroelectric and Relaxor Behavior of Fe-Doped Sr0.5Ba0.5Nb₂_xFeχO6 Ceramics with a Tungsten-Bronze Structure
Jin Soo Kim, | 한국물리학회 | 2007 ,
796
Thickness Dependence of Domain Switching of Ferroelectric PbZr0.35Ti0.65O₃ Thin Film by Scanning Probe Microscopy
Thickness Dependence of Domain Switching of Ferroelectric PbZr0.35Ti0.65O₃ Thin Film by Scanning Probe Microscopy
C. H. Kim, | 한국물리학회 | 2007 ,
797
Temperature Dependence of the Electrical Conductivity for BaTi₂O5 Glass
Temperature Dependence of the Electrical Conductivity for BaTi₂O5 Glass
J. K. Lee, | 한국물리학회 | 2007 ,
798
Ionic Conductivity in Mixed Alkali-Borate Glasses
Ionic Conductivity in Mixed Alkali-Borate Glasses
M. Kim, | 한국물리학회 | 2007 ,
799
Electrical Relaxations of Amorphous χKNbO₃_(₁_x)SiO₂(x=0.33, 0.5, 0.67, 0.8)
Electrical Relaxations of Amorphous χKNbO₃_(₁_x)SiO₂(x=0.33, 0.5, 0.67, 0.8)
C. H. Song, | 한국물리학회 | 2007 ,
800
Domain Switching of Ferroelectric Thin Films by Using a Scanning Probe Microscope
Domain Switching of Ferroelectric Thin Films by Using a Scanning Probe Microscope
J. Y. Son, | 한국물리학회 | 2007 ,
처음이전75767778798081828384이후마지막