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71
Dynamic Characterization of Noise and Vibration Transmission Paths in Linear Cyclic Systems (I)
Dynamic Characterization of Noise and Vibration Transmission Paths in Linear Cyclic Systems (I)
Han Jun Kim,Young Man Cho, | 대한기계학회 | 2000 ,
72
Growth and Characterizationof Al₂O₃Thin Films for the Buffer Insulator in Pt/SrBi₂Nb₂O0/Al₂O₃/Si Ferroelectric Gate Oxide Structure
Growth and Characterizationof Al₂O₃Thin Films for the Buffer Insulator in Pt/SrBi₂Nb₂O0/Al₂O₃/Si Ferroelectric Gate Oxide Structure
Hoon Sang Choi,Geun-Sik Lim,Jong Han Lee, | 대한금속.재료학회 | 2003 ,
73
Characterization of the Chemical Conversion Films that Form on Mg-Al Alloy in Colloidal Silica Solution
Characterization of the Chemical Conversion Films that Form on Mg-Al Alloy in Colloidal Silica Solution
Seong-Jong Kim,Ying Zhou, | 대한금속.재료학회 | 2003 ,
74
Microstructural Characterization of SPD Processed Materials
Microstructural Characterization of SPD Processed Materials
Igor V.Alexandrov, | 대한금속.재료학회 | 2001 ,
75
Characterization of Irradiated Simulated DUPIC Fuel
Characterization of Irradiated Simulated DUPIC Fuel
In-Ha Jung,Kee-Chan Song,Kweon-Ho Kang, | 대한금속.재료학회 | 2001 ,
76
Proton-Induced X-Ray Emission (PIXE) Characterizatio ofSpecial Glasses and Multi-Coated Lenses
Proton-Induced X-Ray Emission (PIXE) Characterizatio ofSpecial Glasses and Multi-Coated Lenses
Y.H.Han,T.A.Cahill.S.J.Kim, | 대한금속.재료학회 | 2001 ,
77
Synthesis and Characterization of Cubic Boron Nitride Thin Films Using the ME-ARE Method
Synthesis and Characterization of Cubic Boron Nitride Thin Films Using the ME-ARE Method
Eungsun Byon, Junghun Lee, Gunhwan Lee, | 대한금속.재료학회 | 2000 ,
78
Characterization of Deformation Behavior For Waspaloy Under Crepp-Fatigue Interaction
Characterization of Deformation Behavior For Waspaloy Under Crepp-Fatigue Interaction
In-Soo Kim, Trevor A. Brown, Jong-Taek Yeom, | 대한금속.재료학회 | 2000 ,
79
Fabrication and Characterization of Al/TiNi Shape Memory Composites
Fabrication and Characterization of Al/TiNi Shape Memory Composites
Changhun Han, Ildong Choi, Kyungmox Cho and Ikmin, | 대한금속.재료학회 | 2000 ,
80
Characterization of the Defect Found in Gold Decoration Layer of Bone China
Characterization of the Defect Found in Gold Decoration Layer of Bone China
C.S.Yoon,D.H.Im,C.K.Kim,Y.C.Chung, | 대한금속.재료학회 | 2000 ,
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1
Semiconductor Wafor Cleaning and Surface Characterization
대한금속재료학회(구 대한금속학회) [기계공학, ]